Productivity Solutions for Probe and Test

Company Profile

Integrated Technology Corporation is a strong believer in the value of intellectual property. Through the years we have developed a portfolio of patents which illustrate our dedication to innovation. These patents fall in many diverse areas and are an indication of the breadth of our experience and capability. The following is a partial list of patents and trademarks developed by, owned by, or assigned to ITC.

US Patent No. 5,657,394
Integrated Circuit Probe Card Inspection System

US Patent No. 6,118,894
Integrated Circuit Probe Card Inspection System

US Patent No. 5,563,781
Dual-Mode Power Converter

US Patent No. 5,189,360
Method and Apparatus for Providing Controlled Mechanical Braking Torque.

US Patent No. 4,949,084
Programmable Integrated Crosspoint Switch

US Patent No. 4,869,497
Computer Controlled Exercise Machine

US Patent No. 4,785,674
Torque Sensor

US Patent No. 5,442,276
Apparatus for Providing Controlled Mechanical Braking Torque

US Patent No. 7,521,947
Probe needle protection method for high current probe testing of power devices

US Patent No. 9,304,147
High currrent Kelvin connection and verification method

US Patent No. 9,759,763
Damage reduction method and apparatus for destructive testing of power semiconductor

US Trademark
Probilt

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