Productivity Solutions for Probe and Test

About ITC

A Letter from Mark McLaren, President of ITC

Integrated Technology Corporation (ITC) is based in Tempe Arizona and has been providing technology solutions to the semiconductor industry since 1975 and has always been driven by the needs of our customers. We are extremely proud of our successful record of listening to our customers and implementing their needs into our equipment.

ITC maintains a policy of using an evolutionary design philosophy so we can offer our existing customers an upgrade path rather than our older equipment becoming obsolete. As a result, we are still able to offer upgrade solutions for equipment that was shipped over 20 years ago.

At ITC, we understand that providing ongoing support to our existing customers is just as important as securing new customers. I firmly believe that our ability to work together with our new and existing customers in developing new features, new probe card analyzer motherboards, or new test capabilities is the key factor in ITC’s success over so many years.

Within our range of probe card metrology systems and Power Semiconductor Test Equipment, we have a solution that meets the requirements of the different technologies and interfaces currently in use and we can match the solution to specific customer needs.

Sincerely,

Mark McLaren
President, Integrated Technology Corporation

 

Company Profile

Integrated Technology Corporation is a strong believer in the value of intellectual property. Through the years we have developed a portfolio of patents which illustrate our dedication to innovation. These patents fall in many diverse areas and are an indication of the breadth of our experience and capability. The following is a partial list of patents and trademarks developed by, owned by, or assigned to ITC.

US Patent No. 5,657,394
Integrated Circuit Probe Card Inspection System

US Patent No. 6,118,894
Integrated Circuit Probe Card Inspection System

US Patent No. 5,563,781
Dual-Mode Power Converter

US Patent No. 5,189,360
Method and Apparatus for Providing Controlled Mechanical Braking Torque.

US Patent No. 4,949,084
Programmable Integrated Crosspoint Switch

US Patent No. 4,869,497
Computer Controlled Exercise Machine

US Patent No. 4,785,674
Torque Sensor

US Patent No. 5,442,276
Apparatus for Providing Controlled Mechanical Braking Torque

US Patent No. 7,521,947
Probe needle protection method for high current probe testing of power devices

US Patent No. 9,304,147
High currrent Kelvin connection and verification method

US Patent No. 9,759,763
Damage reduction method and apparatus for destructive testing of power semiconductor

US Trademark
Probilt

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