Tempe, Arizona - April 14, 2009 - ITC has completed the design and development of a test site multiplexer module and control software that allows the ITC55100 and ITC59100 to test devices at the same contact site.

The advantage of this module is an increase in the number of dynamic tests that can be performed on power MOSFET devices without increasing the number of handler contact sites required.

With this module it is possible to run the Unclamped Inductive Load (UIL) test, Gate Charge (Qg) test and Gate Resistance (Rg) test all on a single handler contact site. Total test time for all three tests including relay switching time and waveform capture is typically less than 130 milliseconds.

The system control software provides the user with a simple interface for starting and ending lots, as well as loading test specifications from the test floor server.

For more detailed information contact sales@inttechcorp.com