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PB1200
The PB1200 bench-top, tips-up probe card repair station provides fast and efficient repair of all cantilever probe cards from the bottom of the probe card and is an ideal solution for multi-DUT shelf cards that cannot be repaired from the top. The system tests the probe card for probe alignment and planarity. Failing probes are identified for the operator and are easily repaired using the visual aids available. Repaired probes are then retested, resulting in a very efficient repair process for even the most complex fine-pitch, multi-die probe cards. Probe card repair times may be reduced by as much as 50%.

ITC59100
The ITC59100 TMU is a production test solution for Gate Charge (Qg) and Internal Gate Resistance (Rg). Both Qg and Rg are automatically tested according to programmed parameters. The system also measures and reports the values of Rdson and the Gate Threshold Voltage (Vth). All measurements can be made on one handler contact site without any additional hardware, leaving other handler stations available for additional tests. Up to 4 TMU’s can run in parallel in a single ITC59000 test system to allow up to 4 separate devices to be tested in parallel with no multiplexing, at test speeds less than 100ms for extremely high throughput.